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Abstract: The techniques and instruments used
to measure flat panel display properties will be detailed. Properties like
uniformity, colors, viewing angles behavior, gray levels separation,
temporal measurements and motion artifacts will be included. High ambient
behavior and reflectivity of both transmissive and reflective displays will
be part of the discussion.
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Presentation
- PDF (22 MB)
Biography: Adi Abileah is chief scientist,
Technology Group, Planar Systems, Beaverton, Oregon.
His main activity is related to development of active matrix liquid crystal
displays (AMLCD), physics and optics of the displays of several
technologies, backlights and enhancement techniques.
Adi has B.Sc. in physics from the Technion (Israel Institute of Technology)
and M.Sc. in Plasma physics from the Hebrew University, Jerusalem. And a
two years research work at the university on high power CO2 lasers.
He developed soil mechanics density sensors at the Negev Institute. His
first industry job was in medical imaging (Nuclear Medicine) at Elscint,
Israel. He was the head of the electro-optics group at Elbit for several
years, and then the manager of EL-OP north brunch R&D center in Haifa,
Israel.
On 1987 he joined OIS - Optical Imaging Systems in Michigan where he became
the manager of the optics group and responsible for all related topics in
the development of AMLCDs. During this period he became expert in the
optics of AMLCDs, testing techniques and liquid crystals physics. He served
at OIS until the company closed at 1998. Since 1998 he joined Planar.
Adi has 31 US patents, mostly related to displays and backlights, and
presented many technical papers at SID, SPIE, and OSA conferences. In 2005
he received the Fellow Award of SID.
The Seminar is free. Please join the speaker
for a no-host dinner after the seminar. Directions to the restaurant will
be provided at the seminar. Non-Members are welcome. RSVP to Gary Johnson
at Gary.Johnson@Tek.com or (503)
627-1985. Please
indicate if you plan to participate in the dinner.
Directions
& Map to Planar Systems
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