Who We Are

 

SID: 

With nearly 7000 members worldwide, SID professionals include a wide range of business and technical disciplines related to electronic display research, design, manufacturing, integration, applications and marketing. Our organization covers the growing need for information display in commercial, medical, government, telecommunications and industrial products.

SID members enjoy a variety of benefits including: Information Display magazine, technical publications and news letters featuring the latest industry technology and business forecasts, SID Trade Show and Technical Conference announcements. In addition, SID Chapters provide display industry networking opportunities via local business and technical events.

 

Delaware Valley Chapter:

With over 200 members, the SID Delaware Valley Chapter covers the Mid Atlantic Region from Pennsylvania to Florida and includes the Student Chapter at the University of Central Florida in Orlando.  Our mission is to promote the understanding, development and manufacturing of electronic displays to provide growth opportunities for our members.

 

Upcoming Event:

 

PHILADELPHIA EMC SOCIETY – CHAPTER MEETING
NON-MEMBERS WELCOME. NO CHARGE. DINNER INCLUDED.
The next meeting of our 2011-2012 season is set for Tuesday February 7 at 5:30pm.
Mark your calendars now! Bring your colleagues, vendors and customers.
Come and meet your peers and our experts. In this economy, now is the time to network!

TOPIC1: Shielding Effectiveness Testing of EMI Gaskets – Past, Present, and Future

Who should attend?
Any individual involved with designing, testing or generally dealing with EMI / EMC.

• DATE: Tuesday, February 7, 2012
• Sponsored by Chomerics Division of Parker Hannifin
• Location: Fort Washington Holiday Inn, Fort Washington, PA
• Directions: 432 West Pennsylvania Avenue • Fort Washington, Pennsylvania 19034
• Networking with food and refreshments: 5:30 p.m.
• Start of meeting / presentations: 6 p.m.
• End approx. 8 p.m.

RSVP NOW!
Reservations: Send an e-mail to eambler@item-media.net no later than 4 p.m. Thursday, February 2, 2012. Please indicate whether you will be attending dinner or just the meeting.

The Philadelphia EMC Society is ALL ABOUT NETWORKING so come early, please. Also, feel free to forward this announcement to any peers or colleagues who may be interested in attending. Bring any promotional literature or business cards you wish to display or distribute. We have a table set up for this purpose.

WE LOOK FORWARD TO SEEING YOU!
TOPIC: Shielding Effectiveness Testing of EMI Gaskets – Past, Present, and Future
 

Presented by Joe Butler, Marketing Manager, Chomerics Division of Parker Hannifin - The determination of the shielding effectiveness properties of EMI gaskets has long been an issue, with the continuous evolution of test methods, yet with no industry consensus on the proper procedure. Beginning in the early 1970’s and continuing to this day, the SAE AE-4 Committee developed several test standards to address the need for assessment of EMI gasketing performance. Around 1980, the government got involved with conductive elastomer EMI gasket evaluation and with an industry group led by EMI gasket manufacturers, developed a tri-service material qualification standard, MIL-G-83528 (now MIL-DTL-83528). Over the years the ASTM D09 Committee was briefly involved with developing EMI gasket shielding effectiveness procedures and the IEEE EMC Society studied the issue as well, introducing MIL-STD 1302 which provides some overview on current peer reviewed standards as well as a commentary on emerging procedures. However, despite all of the activity within the formal standards development bodies, manufacturers of EMI gaskets have habitually developed their own internal test procedures or used modifications of the military shelter shielding effectiveness test procedures, MIL-STD-285 and its replacement, IEEE-STD-299. Looking towards the future, EMI gasket evaluations will likely be affected by the use of reverberation chambers measurements, especially as the new sections of IEEE-STD-299 for smaller enclosures are developed, and IEC 6100-4-21 is embraced. Unfortunately, EMI gasket shielding effectiveness performance determination may still remain without industry consensus.
 

Bio – Joe Butler - Joe has over 35 years experience as an electromagnetic compatibility engineer, having worked in both the military and commercial industry for Raytheon, GenRad, and RCA in addition to his past 25 years at Chomerics. He is a senior life member and Past-President of the Institute of Electrical and Electronic Engineers (IEEE) Electromagnetic Compatibility Society (EMCS). He was awarded the IEEE Third Millennium Medal in 2000 for “Outstanding Achievements and Contributions”. Joe is also a past member of the IEEE EMCS Standards Committee and has been involved with EMC standards development within the American National Standards Institute (ANSI), the American Society for Testing and Materials (ASTM), the Association for the Advancement for Medical Instrumentation (AAMI) and the SAE (Society of Automotive Engineers). He has also previously been involved with EMC standards work with the Radio Technical Commission for Aeronautics (RTCA), the Electronic Industries Alliance (EIA), and the Scientific Apparatus Makers Association (SAMA). He is a National Association of Radio and Telecommunications Engineers (NARTE) certified EMC engineer and is a past member of the Board of Directors of NARTE. Joe has a BS in Engineering Physics from Merrimack College, an MA in Physics from Williams College, and an MBA from Northeastern University.